Influence of heating profiles on crack inspection in polysilicon photovoltaic cells using electronic speckle pattern interferometry
碩士 === 國立交通大學 === 機械工程系所 === 101 === The 6-inch polysilicon wafers for use of photovoltaic (PV) cells are thin enough, and possess both flexibility and brittleness. The latent defects which could not be found in PV cells by the unaided eye in the production line usually result in efficiency reduct...
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| Format: | Others |
| Language: | zh-TW |
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2013
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| Online Access: | http://ndltd.ncl.edu.tw/handle/82039788173281635806 |