Design optimization towards zero soft errors for safety-critical applications
碩士 === 國立交通大學 === 電機工程學系 === 101 === Soft errors have been a critical concern for reliability of advanced CMOS designs due to technology scaling. Moreover, along with the rapid growth of medical, automotive, and aerospace electronics, extremely high demand on reliability becomes the paramount concer...
| Main Authors: | , |
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| Format: | Others |
| Language: | en_US |
| Published: |
2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/87755832981434854646 |