Applying Kappa Analysis Method in Assessing the Attribute Agreement of Inspectors-A case study of a Semiconductor Testing House
碩士 === 國立交通大學 === 管理學院工業工程與管理學程 === 101 === Due to the serious competition of the international market, requirements of product /process quality from customers are increasing rapidly. Consequently, on the precise measuring system to ensure the product/process quality depends the Semiconductor manufa...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2013
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| Online Access: | http://ndltd.ncl.edu.tw/handle/b4ey75 |