Fabrication and Characterization of Stacked HfO2/ZnO nanorod Resistive Switching Memory

碩士 === 國立暨南國際大學 === 電機工程學系 === 101 === The resistive switching random access memory (RRAM) has the advantages of low power consumption, fast switching speed, satisfactory switching endurance, high density, and simple structure., and has become one of the promising candidates for next generation new...

Full description

Bibliographic Details
Main Authors: Shiang-Ping Sung, 宋湘平
Other Authors: You-Lin Wu
Format: Others
Language:zh-TW
Published: 2013
Online Access:http://ndltd.ncl.edu.tw/handle/20755079261550195536