Enhanced Performances of GaN-based MOS-HEMTs by Surface Passivation and Post Oxide Annealing

碩士 === 國立成功大學 === 微電子工程研究所碩博士班 === 101 === The research is mainly investigated on the improvement of hydrogen peroxide (H2O2) Metal-Oxide-Semiconductor high electron mobility transistor by using post oxide annealing (POA). Hydrogen peroxide has a strong oxidation capability, it can oxidize the surfa...

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Bibliographic Details
Main Authors: Wen-ChiaOu, 歐文家
Other Authors: Wei-Chou Hsu
Format: Others
Language:en_US
Published: 2013
Online Access:http://ndltd.ncl.edu.tw/handle/43386885006452789517

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