Development of thin film shaker mechanical spectroscopy
碩士 === 國立成功大學 === 土木工程學系碩博士班 === 101 === This research is to refine the Thin Film Shaker (TFS) device to measure mechanical properties of materials, such as Young’s modulus, shear modulus and loss tangent. The classical Euler-Bernoulli beam model works well to extract the Young’s modulus of the thin...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2013
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| Online Access: | http://ndltd.ncl.edu.tw/handle/64834810100125756444 |