Study on the Recovery Effect and Instability of Threshold Voltage of Amorphous Silicon TFTs under DC/AC Stresses
碩士 === 國立中興大學 === 光電工程研究所 === 101 === Amorphous silicon thin film transistors, although the carrier mobility and device stability were not as good as poly-Si thin film transistors, due to the development of longer maturity of the technology and the low cost, therewas still valuable exploration on th...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2013
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/xvzskm |