Optical Inspection for The Defects of Patterned Sapphire Substrate
碩士 === 龍華科技大學 === 工程技術研究所 === 101 === The main purpose of this study is to design an optical inspection system for testing defects on the Patterned Sapphire Substrate. When designing an optical inspection system we use image processing tools such as Visual C++ with OpenCV. First, we must use the CMO...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2013
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| Online Access: | http://ndltd.ncl.edu.tw/handle/97083140887488095624 |