The Study of Defects in Oxide Semiconductor

碩士 === 大葉大學 === 電機工程學系 === 101 === In this study, we investigated the ZnO film using Rrapid Thermal Chemical Vapor Deposition (RTCVD). The optical transmittance of the thin film can reach to average 80%. In Atomic Force Microscope (AFM), we can observed that some of the region were collapsed. The co...

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Bibliographic Details
Main Authors: Yu-Ying Chang, 張裕盈
Other Authors: Jung-Chuan Fan
Format: Others
Language:zh-TW
Published: 2013
Online Access:http://ndltd.ncl.edu.tw/handle/58962061033278820463