Study of Punch Through Mechanism in Single-sided Non-Overlapped Implantation nMOSFETs
碩士 === 中原大學 === 電子工程研究所 === 101 === Non-volatile memories play more and more important roles with the development of the portable microelectronic products. In this work, a novel one-time-programmable single-sided non-overlapped implantation (SNOI) anti-fuse cell is investigated. The anti-fuse ce...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2013
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| Online Access: | http://ndltd.ncl.edu.tw/handle/32g29t |