Electronic Products Reuse Assessment Based on Failure Precursors Using Competing Failure Mode Method
碩士 === 中原大學 === 工業與系統工程研究所 === 101 === From the retired electronic products, many of high value components can be reused in other products as certified reused components for refurbished products or certified spare parts. Certification of a reused component should be checked first on its functional p...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2013
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/08766008944798528963 |