A Numerical Analysis of the Flexural Strength of Thin TSV Wafer Die

碩士 === 國立中正大學 === 機械工程學系暨研究所 === 100 === Light weight, small size, low voltage, and low cost are the mainly request of high performance IC product; on the other hand, it also means the spacing for IC system is very limited. Therefore to develop the Through Silicon Via (TSV) Stacked-Die Packaging (SD...

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Bibliographic Details
Main Authors: Zhang, Zhanwei, 張展維
Other Authors: Liu, D. S.
Format: Others
Language:zh-TW
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/20325665312785456956