Broadband on-wafer calibration technique with applications of CMOS active and passive device S-parameter measurements
碩士 === 元智大學 === 通訊工程學系 === 100 === In this thesis, the commercial impedance standard substrate is firstly adapted to calibrate the system errors to the probe tips using LRM or LRRM techniques. Then the proposed calibration method is applied to evaluate the error terms for de-embedding purpose, there...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Online Access: | http://ndltd.ncl.edu.tw/handle/84280427318338663845 |