Pattern-Coupling-LFSR for Test Data Compression

• Main Authors: Hsing-Cheng Huang, 黃行正
• Other Authors: 曾王道
• Format: Others
• Language: zh-TW
• Online Access: http://ndltd.ncl.edu.tw/handle/05019414094818374517

碩士 === 元智大學 === 資訊工程學系 === 100 === To reduce the test data volumes, test data compression is a common and efficient method. This thesis is based on LFSR (Linear Feedback Shift Register) as the frame-work to develop a new data compression method to improve the compression ratio. The traditional method used one test cubes to produce one seed. The proposed method used two test cubes to produce one seed. This method can achieve significant compres-sion ratio. Experimental results for the large ISCAS’89 benchmark circuits have dem-onstrated the proposed approach can improve the test data compression ratio.