Channel-Hot-Carrier Effect on 65 nm Wide/Narrow Width MOSFETs with Temperature Variations
碩士 === 國立虎尾科技大學 === 光電與材料科技研究所 === 100 === For a long time, channel hot carrier (CHC) effect is a major reliability issue of metal-oxide-semiconductor field-effect transistors (MOSFET). Due to the MOSFET dimension reduction in a limited and the oxide field increases quickly. This leads to apparently...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/30682924792687132796 |