A Grey Weighting Density-Based Clustering Algorithm And LAO Wafer Defect Inspection Application
碩士 === 國立臺灣科技大學 === 自動化及控制研究所 === 100 === This thesis proposes Grey Weighting Density-Based Clustering Algorithm of Applications with Noise (GWDBSCAN). The algorithm uses data point gray value in four-quadrant for next growing concept of guidance. The growth direction is determined by the data point...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/72589855567977041978 |