Fatigue Life and Reliability Analysis of Electronic Packages under High Temperature and Moisture Conditions

碩士 === 國立臺灣大學 === 機械工程學研究所 === 100 === Many previous researches on electronic packages focused on assessment of package lives under a single state of stress such as vibration, thermal cycling, drop impact, temperature and humidity. The present study considers both effects of thermal cycling and mois...

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Bibliographic Details
Main Authors: Chih-Min Hsu, 許志敏
Other Authors: 吳文方
Format: Others
Language:zh-TW
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/66664685973269858086