Transient IR-drop Analysis for At-speed Testing Using Representative Random Walk
碩士 === 國立臺灣大學 === 電子工程學研究所 === 100 === This thesis presents a representative random walk technique for fast transient IR-drop analysis. Representative random walk selects only a small number of nodes to model original network for simulation so that the memory and run time are significantly reduced....
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| Format: | Others |
| Language: | en_US |
| Published: |
2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/08841501289029518339 |