Design and Implementation of Low Thermal Drift and Low-Noise Capacitive Multi-Channel Sensing Interface CMOS-MEMS Accelerometers

博士 === 國立清華大學 === 奈米工程與微系統研究所 === 100 === There are many different fabrication processes for Micro-Electro-Mechanical System (MEMS). However, the standard fabrication process is a major factor which plays an important role in MEMS. In this study, a capacitive sensing chip is proposed to use TSMC 0.3...

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Main Authors: Liu, Yu-Chia, 劉育嘉
Other Authors: Fang, Weileun
Format: Others
Language:zh-TW
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/83365996554147688064
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spelling ndltd-TW-100NTHU57950092015-10-13T21:22:41Z http://ndltd.ncl.edu.tw/handle/83365996554147688064 Design and Implementation of Low Thermal Drift and Low-Noise Capacitive Multi-Channel Sensing Interface CMOS-MEMS Accelerometers 低熱變形與低雜訊之多通道電容感測界面CMOS-MEMS加速度感測器的設計與實現 Liu, Yu-Chia 劉育嘉 博士 國立清華大學 奈米工程與微系統研究所 100 There are many different fabrication processes for Micro-Electro-Mechanical System (MEMS). However, the standard fabrication process is a major factor which plays an important role in MEMS. In this study, a capacitive sensing chip is proposed to use TSMC 0.35 μm 2-polysilicon 4-Metal (2P4M) standard process. Two novel designs together with capacitive interface circuitry of accelerometers were respectively proposed in thesis. First study presents a simple approach to improve the performance of CMOS-MEMS capacitive accelerometer by means of the post-CMOS metal electroplating process. The metal layer can be selectively electroplated on the MEMS structures at low temperature; and the thickness of metal layer can be easily adjusted by process. Thus, the performance of capacitive accelerometer (i.e., structure deformation, sensitivity) can be improved significantly. Second study proposed the stacking of pure oxide layers as the mechanical structures for CMOS-MEMS accelerometer has been developed and demonstrated for the first time. Thus, the distribution of metal-oxide composites in CMOS-MEMS accelerometer is changed from area to line. Such design has the following advantages to solve the initial deformation of suspended MEMS structures due to the residual stresses of metal-oxide films, as well as the thermal deformation of suspended MEMS structures due to the thermal expansion coefficient (CTE) mismatch of metal-oxide films. The parasitic capacitance of sensing electrodes routing underneath the proof-mass also can be further reduced. In addition, the CMOS multi-channel readout circuit on a single chip was developed to sense the time-varient sensing signal. Thus, the smallest footprint of chip size can be achieved. Fang, Weileun 方維倫 2012 學位論文 ; thesis 169 zh-TW
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language zh-TW
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sources NDLTD
description 博士 === 國立清華大學 === 奈米工程與微系統研究所 === 100 === There are many different fabrication processes for Micro-Electro-Mechanical System (MEMS). However, the standard fabrication process is a major factor which plays an important role in MEMS. In this study, a capacitive sensing chip is proposed to use TSMC 0.35 μm 2-polysilicon 4-Metal (2P4M) standard process. Two novel designs together with capacitive interface circuitry of accelerometers were respectively proposed in thesis. First study presents a simple approach to improve the performance of CMOS-MEMS capacitive accelerometer by means of the post-CMOS metal electroplating process. The metal layer can be selectively electroplated on the MEMS structures at low temperature; and the thickness of metal layer can be easily adjusted by process. Thus, the performance of capacitive accelerometer (i.e., structure deformation, sensitivity) can be improved significantly. Second study proposed the stacking of pure oxide layers as the mechanical structures for CMOS-MEMS accelerometer has been developed and demonstrated for the first time. Thus, the distribution of metal-oxide composites in CMOS-MEMS accelerometer is changed from area to line. Such design has the following advantages to solve the initial deformation of suspended MEMS structures due to the residual stresses of metal-oxide films, as well as the thermal deformation of suspended MEMS structures due to the thermal expansion coefficient (CTE) mismatch of metal-oxide films. The parasitic capacitance of sensing electrodes routing underneath the proof-mass also can be further reduced. In addition, the CMOS multi-channel readout circuit on a single chip was developed to sense the time-varient sensing signal. Thus, the smallest footprint of chip size can be achieved.
author2 Fang, Weileun
author_facet Fang, Weileun
Liu, Yu-Chia
劉育嘉
author Liu, Yu-Chia
劉育嘉
spellingShingle Liu, Yu-Chia
劉育嘉
Design and Implementation of Low Thermal Drift and Low-Noise Capacitive Multi-Channel Sensing Interface CMOS-MEMS Accelerometers
author_sort Liu, Yu-Chia
title Design and Implementation of Low Thermal Drift and Low-Noise Capacitive Multi-Channel Sensing Interface CMOS-MEMS Accelerometers
title_short Design and Implementation of Low Thermal Drift and Low-Noise Capacitive Multi-Channel Sensing Interface CMOS-MEMS Accelerometers
title_full Design and Implementation of Low Thermal Drift and Low-Noise Capacitive Multi-Channel Sensing Interface CMOS-MEMS Accelerometers
title_fullStr Design and Implementation of Low Thermal Drift and Low-Noise Capacitive Multi-Channel Sensing Interface CMOS-MEMS Accelerometers
title_full_unstemmed Design and Implementation of Low Thermal Drift and Low-Noise Capacitive Multi-Channel Sensing Interface CMOS-MEMS Accelerometers
title_sort design and implementation of low thermal drift and low-noise capacitive multi-channel sensing interface cmos-mems accelerometers
publishDate 2012
url http://ndltd.ncl.edu.tw/handle/83365996554147688064
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