The Studies of Process Optimization and Effective Work Function Tuning on Nano Scale High-k/Metal Gate PMOSFETs

博士 === 國立清華大學 === 材料科學工程學系 === 100 === To sustain CMOS transistor continuously scaling, high-k and metal gate technology has become the foundation of logic CMOS technology. Because of the direct tunneling effect, a high gate leakage will be induced in the conventional Poly/SiON gate with a very th...

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Bibliographic Details
Main Authors: Chen, Yi-Wen, 陳奕文
Other Authors: Lin, Su-Jien
Format: Others
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/56037237181982454836