Morphology study and defect analysis of encapsulated cholesteric LCD

• Main Authors: Heng-Yi Tseng, 曾衡逸
• Other Authors: Tsung-Hsien Lin
• Format: Others
• Language: zh-TW
• Published: 2012
• Online Access: http://ndltd.ncl.edu.tw/handle/79866903030432262743

碩士 === 國立中山大學 === 光電工程學系研究所 === 100 === This thesis studies the reliability issues of encapsulated cholesteric LCD, and analyzes the defective pixel. Adjusting fabrication process parameters, we change the thickness of the buffer layer and absorption layer to explore the influence of different boundaries to CLC. It is found that the buffer layer can provide a good protection. When the buffer layer is getting thicker, the less the defective pixels appear, and the absorption layer cannot induce defect. The reflection band of the ITRI’s encapsulated CLCs blue shifts to UV band and then become defective pixel. When CLCs exposed to the atmosphere with large area, the reflected color will be shifted. The shift of reflection band is due to CLC’s inherent properties. Different kind of CLC has different properties, and we found the reflection band of ITRI’s CLC is blue shift and the nematic E48 with chiral dopant R811 is red. Mixing different features of CLCs with appropriate proportion can reduce the color shift. In conclusion, mixing different characteristics CLCs with appropriate proportion and providing good protection to encapsulated CLC, we can reduce CLC’s color shift and restrain the defective pixel.