Morphology study and defect analysis of encapsulated cholesteric LCD

碩士 === 國立中山大學 === 光電工程學系研究所 === 100 === This thesis studies the reliability issues of encapsulated cholesteric LCD, and analyzes the defective pixel. Adjusting fabrication process parameters, we change the thickness of the buffer layer and absorption layer to explore the influence of different bound...

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Bibliographic Details
Main Authors: Heng-Yi Tseng, 曾衡逸
Other Authors: Tsung-Hsien Lin
Format: Others
Language:zh-TW
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/79866903030432262743