Study of intermediate carbon layer between the insulated layer and electrodes of resistive random access memory device

碩士 === 國立屏東教育大學 === 應用物理系 === 100 === Resistive random access memory (RRAM) has been considered as a potential memory device for next generation electronics. One of the problems of RRAM is the choice of electrode material. The Pt electrode has usually been chosen as a bottom electrode of RRAM. Pt is...

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Bibliographic Details
Main Authors: Min-hsiang Chuang, 莊閔翔
Other Authors: none
Format: Others
Language:zh-TW
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/01906992370556583616