Improved the ESD capability of 0.5μm high voltage device
碩士 === 國立交通大學 === 工學院半導體材料與製程設備學程 === 100 === In the real world, electronic product or could malfunction or be damaged when the electronic product to be subjected to Electrostatic Discharge (ESD) event. So the ESD event is an important issue of electronic product. All product must be pass ESD test b...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/91249501988745883665 |