Study on Electrical Characteristics and Physical
博士 === 國立交通大學 === 光電工程學系 === 100 === In order to investigate the mechanism of photo leakage current of poly-Si TFT, the poly-Si TFTs with patterned metal shielding layer are used to study. The location of the exposed region in poly-Si layer is defined by employing the proposed structure. The expose...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/51023890582627107516 |