A New Measurement Method of High Resolution in PWM Duty Testing Technique

碩士 === 國立交通大學 === 電機學院電機與控制學程 === 100 === This thesis proposes a novel and high resolution measurement technique on SOC for PWM Ton、Toff and Duty testing by use of logic test channel of an ATE. It accomplishes Duty cycles measurement by use of dual comparators only. We would like to investigate a no...

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Bibliographic Details
Main Authors: Chen, Chun-Lung, 陳俊隆
Other Authors: Chen, Ke-Horng
Format: Others
Language:en_US
Published: 2011
Online Access:http://ndltd.ncl.edu.tw/handle/20607638436099653589