Thermal Simulation Techniques for Very Large Scale Integration (VLSI) Circuits

博士 === 國立交通大學 === 電信工程研究所 === 100 === The continuously scaling down of the CMOS technology results in high on-chip power density, and this fact leads to high on-chip temperature in modern very large scale Integration (VLSI) circuits. On-chip temperature influences the performance and the reliability...

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Main Authors: Huang, Pei-Yu, 黃培育
Other Authors: Lee, Yu-Min
Format: Others
Language:en_US
Published: 2011
Online Access:http://ndltd.ncl.edu.tw/handle/43360846300516157399
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spelling ndltd-TW-100NCTU54350392016-04-04T04:17:12Z http://ndltd.ncl.edu.tw/handle/43360846300516157399 Thermal Simulation Techniques for Very Large Scale Integration (VLSI) Circuits 超大型積體電路的熱分析技術 Huang, Pei-Yu 黃培育 博士 國立交通大學 電信工程研究所 100 The continuously scaling down of the CMOS technology results in high on-chip power density, and this fact leads to high on-chip temperature in modern very large scale Integration (VLSI) circuits. On-chip temperature influences the performance and the reliability, and it also increases the power consumption of the circuits. Therefore, researchers have devoted to thermal-aware optimization techniques. Since the thermal-aware optimization engines require performing numerous thermal simulations in their optimization loops, an efficient and accurate thermal analyzer is essential for thermal-aware design flow. In this dissertation, three accurate and efficient thermal simulators for early stage thermal-aware design engines are proposed. Given the deterministic on-chip power profile, the first simulator represents the on-chip temperature profile by a set of bases. Then, a fast Fourier transform based algorithm is developed to obtain the on-chip temperature profile. Based on the above simulation framework, the first proposed simulator also provides the thermal simulation for the stacked-chip or the contactless interconnection based three-dimensional integrated circuits (3-D ICs). To take into account the impacts of the process variation and the temperature to leakage powers, the second simulator provides two electro-thermal simulation frameworks to accurately and efficiently predict the fluctuation of on-chip temperature profile. Moreover, to ensure the on-chip thermal reliability and provide more meaningful thermal costs for thermal-aware design engines, the second simulator can efficiently deliver the thermal yield profile, which is the probability profile of the temperature being less or equal to a user specified threshold temperature. To provide the thermal estimation for early stage thermal-aware design engines for the through silicon via based 3-D ICs, the third proposed simulator provides a look-up table based thermal simulation framework. With the look-up table based framework, the time consumed dealing processes for the thermal conductance matrix of the equivalent thermal circuit can be avoided. The experimental results have demonstrated the high-accuracy and high-efficiency of all the three proposed thermal simulators. Lee, Yu-Min 李育民 2011 學位論文 ; thesis 152 en_US
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language en_US
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description 博士 === 國立交通大學 === 電信工程研究所 === 100 === The continuously scaling down of the CMOS technology results in high on-chip power density, and this fact leads to high on-chip temperature in modern very large scale Integration (VLSI) circuits. On-chip temperature influences the performance and the reliability, and it also increases the power consumption of the circuits. Therefore, researchers have devoted to thermal-aware optimization techniques. Since the thermal-aware optimization engines require performing numerous thermal simulations in their optimization loops, an efficient and accurate thermal analyzer is essential for thermal-aware design flow. In this dissertation, three accurate and efficient thermal simulators for early stage thermal-aware design engines are proposed. Given the deterministic on-chip power profile, the first simulator represents the on-chip temperature profile by a set of bases. Then, a fast Fourier transform based algorithm is developed to obtain the on-chip temperature profile. Based on the above simulation framework, the first proposed simulator also provides the thermal simulation for the stacked-chip or the contactless interconnection based three-dimensional integrated circuits (3-D ICs). To take into account the impacts of the process variation and the temperature to leakage powers, the second simulator provides two electro-thermal simulation frameworks to accurately and efficiently predict the fluctuation of on-chip temperature profile. Moreover, to ensure the on-chip thermal reliability and provide more meaningful thermal costs for thermal-aware design engines, the second simulator can efficiently deliver the thermal yield profile, which is the probability profile of the temperature being less or equal to a user specified threshold temperature. To provide the thermal estimation for early stage thermal-aware design engines for the through silicon via based 3-D ICs, the third proposed simulator provides a look-up table based thermal simulation framework. With the look-up table based framework, the time consumed dealing processes for the thermal conductance matrix of the equivalent thermal circuit can be avoided. The experimental results have demonstrated the high-accuracy and high-efficiency of all the three proposed thermal simulators.
author2 Lee, Yu-Min
author_facet Lee, Yu-Min
Huang, Pei-Yu
黃培育
author Huang, Pei-Yu
黃培育
spellingShingle Huang, Pei-Yu
黃培育
Thermal Simulation Techniques for Very Large Scale Integration (VLSI) Circuits
author_sort Huang, Pei-Yu
title Thermal Simulation Techniques for Very Large Scale Integration (VLSI) Circuits
title_short Thermal Simulation Techniques for Very Large Scale Integration (VLSI) Circuits
title_full Thermal Simulation Techniques for Very Large Scale Integration (VLSI) Circuits
title_fullStr Thermal Simulation Techniques for Very Large Scale Integration (VLSI) Circuits
title_full_unstemmed Thermal Simulation Techniques for Very Large Scale Integration (VLSI) Circuits
title_sort thermal simulation techniques for very large scale integration (vlsi) circuits
publishDate 2011
url http://ndltd.ncl.edu.tw/handle/43360846300516157399
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