Thermal Simulation Techniques for Very Large Scale Integration (VLSI) Circuits

博士 === 國立交通大學 === 電信工程研究所 === 100 === The continuously scaling down of the CMOS technology results in high on-chip power density, and this fact leads to high on-chip temperature in modern very large scale Integration (VLSI) circuits. On-chip temperature influences the performance and the reliability...

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Bibliographic Details
Main Authors: Huang, Pei-Yu, 黃培育
Other Authors: Lee, Yu-Min
Format: Others
Language:en_US
Published: 2011
Online Access:http://ndltd.ncl.edu.tw/handle/43360846300516157399