Thermal Simulation Techniques for Very Large Scale Integration (VLSI) Circuits
博士 === 國立交通大學 === 電信工程研究所 === 100 === The continuously scaling down of the CMOS technology results in high on-chip power density, and this fact leads to high on-chip temperature in modern very large scale Integration (VLSI) circuits. On-chip temperature influences the performance and the reliability...
Main Authors: | , |
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Other Authors: | |
Format: | Others |
Language: | en_US |
Published: |
2011
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Online Access: | http://ndltd.ncl.edu.tw/handle/43360846300516157399 |