Device Threshold Voltage Measurement Circuit of Nano-scale CMOS SRAM
碩士 === 國立交通大學 === 電子研究所 === 100 === Variation issue is one of the key design factors for robust current VLSI systems, and this kind of issue will affect the device threshold voltage (VTH) value. However, the VTH value is still associated with the device performance, stability and reliability, then w...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2011
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| Online Access: | http://ndltd.ncl.edu.tw/handle/60550065200696051283 |