Using Design of Experiment to Improve Wafer Testing Overkill Problem-Case Study of A Wafer Testing Company
碩士 === 國立交通大學 === 管理學院工業工程與管理學程 === 100 === The development of IC（Integrated Circuits）faces small volume and high density as a result of semiconductor process technology continuously improves in recent years,wafer testing process has become especially importment in the semiconductor industry.In wafe...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/86911553423170175187 |