Development of a Hemispherical Radiative Properties Measurement System and Experimentally Demonstration of Unique Features in Spectra from Micro/Nano-scale Structures

碩士 === 國立成功大學 === 機械工程學系碩博士班 === 100 === Recently research in radiative properties of micro/nano structures depend on how to construct it by different geometric, dimension and material is popular. After micro/nano structures was fabricated, it should be verified by equipment that use for measuring r...

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Bibliographic Details
Main Authors: Yu-FanChang, 張宇凡
Other Authors: Yu-Bin Chen
Format: Others
Language:zh-TW
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/79535512683287373784