A Study of Low Cost TSV Testing Methods in 3D-IC

碩士 === 國立中興大學 === 資訊科學與工程學系所 === 100 ===

Bibliographic Details
Main Authors: Yu-Siao Chen, 陳俞孝
Other Authors: Sying-Jyan Wang
Format: Others
Language:zh-TW
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/38234939803355442306