Reaction kinetics at the interface of Ni-based under bump metallization in solder joints

博士 === 國立中興大學 === 材料科學與工程學系所 === 100 === As the speed and functionality of CPUs rapidly increases in the past decades, a high density of flip-chip I/O (input/output) counts is required. By 2011, the size of flip-chip solder bumps had been approaching 1~5 µm and is expected to shrink faster than ever...

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Bibliographic Details
Main Authors: Kuan-Chih Huang, 黃冠誌
Other Authors: Fuh-Sheng Shieu
Format: Others
Language:en_US
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/66114682665676255354