Study on the Degradation Mechanism of P-type Low Temperature Poly-Si Thin Film Transistors under AC Stress

碩士 === 國立中興大學 === 光電工程研究所 === 100 === Low temperature poly-Si thin film transistors (LTPS TFTs) have attracted much attention in recent years because the carrier mobility is several orders of magnitude higher than amorphous silicon TFTs. Howerver, in driving circuits, P-type poly-Si TFTs are subjec...

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Bibliographic Details
Main Authors: Po-Chun Chan, 詹博鈞
Other Authors: Han-Wen Liu
Format: Others
Language:zh-TW
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/08162067844414770674