Application Of Back-Propagation Neural Network To LED Die Defect Inspection

碩士 === 遠東科技大學 === 機械工程研究所 === 100 === This thesis uses the back-propagation neural network to recognize two types defects of LED die automatically. First of all, a LED die recognition process will be developed. The Otsu's method and template-matching techniques are employed in this recognition...

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Bibliographic Details
Main Authors: Wang, Bo-Wei, 王柏崴
Other Authors: Chen, Shih-Hung
Format: Others
Language:zh-TW
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/37603930264899335770