Development of Auto-Detection System for High Brightness LED Surface Defect with Machine Vision.

碩士 === 中原大學 === 機械工程研究所 === 100 === For current Light Emitting Diode (LED) manufacturer, one of the most important goals is to enhance the yield rate and reduce the production cost. To enhance the yield rate, most companies have set up the inspection departments to manually perform the task of def...

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Bibliographic Details
Main Authors: Hsien-Feng Chiu, 邱顯峯
Other Authors: Yi-Hung Liu
Format: Others
Language:zh-TW
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/71640108102782803302