Defect Analysis and Yield Improvement Study for the Printing Process of Multi-layer Ceramic Capacitors Using Customer Complaint Data

碩士 === 中原大學 === 工業與系統工程研究所 === 100 === Various types of electronic products focus on particular emphasis on the import compact size and low power consumption trend at the novelty change the occasion. The smaller 0201 inch components of Multilayer ceramic capacitor are under increasing demand. Lo...

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Bibliographic Details
Main Authors: Ming-Hao Hsu, 許銘浩
Other Authors: Hui-Fen Chen
Format: Others
Language:zh-TW
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/19354673078878263306