Defect inspection and thickness measurement of conducting glass with optical coherence tomography
碩士 === 長庚大學 === 電機工程學系 === 100 === Optical coherence tomography (OCT) has several advantages of no-invasive, depth-resolved, and high-resolution characteristics, which can be used for the reconstruction of microstructures at a depth range of 2-3 mm. In this study, OCT system is implemented for optic...
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| Format: | Others |
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2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/70638917714498011922 |