A Study of Mura Defect Detection on LCD Panels

碩士 === 淡江大學 === 資訊工程學系碩士班 === 99 ===   Panel in the production process, it may be non-uniform on the panel points of light and dark, where is the flaw. On the detection of defects, mainly based on manual inspection currently, it need to rely on a large number of human, and because of the instability...

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Bibliographic Details
Main Authors: Chi-Yuen Chen, 陳麒遠
Other Authors: Wen-Bing Horng
Format: Others
Language:zh-TW
Published: 2011
Online Access:http://ndltd.ncl.edu.tw/handle/73155333062506895874