High Accelerate Life Test Plan and Life Prediction Model for Light Emitting Diode package

碩士 === 國立虎尾科技大學 === 光電與材料科技研究所在職專班 === 99 === This study used the statistics construct to estimate the LED backlight model lifetime. For LED backlight model, the lifetime request is higher and higher, consequently we make use of the reliability and HALT model to analyze and obtain the actual lifetim...

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Bibliographic Details
Main Authors: Yu-Fen Tsai, 蔡裕豊
Other Authors: Wen-Ray Chen
Format: Others
Language:zh-TW
Published: 2011
Online Access:http://ndltd.ncl.edu.tw/handle/75qu63