Defect Related Effects of CIGS and
碩士 === 國立臺灣大學 === 電機工程學研究所 === 99 === In this thesis, the photoluminescence, external quantum efficiency and J-V curve measurement are used to characterize defect information for Cu(In,Ga)Se2 and α-Si based thin film solar cells. First, the photoluminescence of defect-related Cu(In,Ga)Se2 thin film...
| Main Authors: | , |
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| Format: | Others |
| Language: | en_US |
| Published: |
2011
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| Online Access: | http://ndltd.ncl.edu.tw/handle/90619720768354920320 |