Compact Test Pattern Selection for Small Delay Defect
碩士 === 國立臺灣大學 === 電子工程學研究所 === 99 === Testing for small delay defect (SDD) is necessary for ensuring product quality in modern nanometer technologies. Existing commercial tools such as transition fault Automatic Test Pattern Generation (ATPG) tools and timing-aware ATPG tools are either inefficient...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2011
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/91803745070286953546 |