Parallel Detection and Quantification of Thin-Film Peptides with Dynamic-Secondary Ion Mass Spectrometry (D-SIMS) Excited by C60+-Ar+ Co-Sputtering
碩士 === 國立臺灣大學 === 材料科學與工程學研究所 === 99 === Using pulsed primary cluster ions, especially for C60+ cluster ion, time-of-flight secondary ion mass spectrometry (ToF-SIMS) has been shown to be a promising technique for analyzing biological specimens. With molecular secondary ions of high mass, multiple m...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2011
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| Online Access: | http://ndltd.ncl.edu.tw/handle/75941146197974382243 |