Photoelectrochemical water splitting photocurrent mapping using a conductive atomic force microscope
碩士 === 國立臺灣海洋大學 === 光電科學研究所 === 99 === This thesis presents a technique utiliing atomic force microscope(AFM) fordetection of local photoelectrochemical (PEC) water splitting photocurrent on a semiconductor surface. Utilizing the water bridge that forms between the AFM tip and a GaN substrate as the...
Main Authors: | Jian-Min Shiu, 徐健民 |
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Other Authors: | Jih-Shang Hwang |
Format: | Others |
Language: | zh-TW |
Published: |
2011
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Online Access: | http://ndltd.ncl.edu.tw/handle/44063410624737795536 |
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