Photoelectrochemical water splitting photocurrent mapping using a conductive atomic force microscope

碩士 === 國立臺灣海洋大學 === 光電科學研究所 === 99 === This thesis presents a technique utiliing atomic force microscope(AFM) fordetection of local photoelectrochemical (PEC) water splitting photocurrent on a semiconductor surface. Utilizing the water bridge that forms between the AFM tip and a GaN substrate as the...

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Bibliographic Details
Main Authors: Jian-Min Shiu, 徐健民
Other Authors: Jih-Shang Hwang
Format: Others
Language:zh-TW
Published: 2011
Online Access:http://ndltd.ncl.edu.tw/handle/44063410624737795536