The Development of the Wafer Mounter Detecting System
碩士 === 國立彰化師範大學 === 機電工程學系 === 99 === The purpose of this study is to evaluate the quality of the pasted thin film on the wafer surface by using Image Process Technology and the motion control system to make up the automatic optic inspect system. Design of the automatic image examination system...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2011
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/33767583715472264254 |