Ultrafast Time-resolved Study of CIGS Films
碩士 === 國立交通大學 === 電子物理系所 === 99 === Make use of Photoluminescence detection system to measure stationary fluorescence spectra, CIGS thin film, sample (1) to (3) correspond to CIGS、Cd_Cu and V_Cu,respectively. Comparing with CIGS defect model, the other possible transition mechanisms are D transit...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2011
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| Online Access: | http://ndltd.ncl.edu.tw/handle/27165468758542446647 |