Design-for-Debug Layout Adjustment for FIB Probing and Circuit Editing
碩士 === 國立交通大學 === 電子研究所 === 99 === While the technology node continually and aggressively scales, the resolution of FIB techniques does not scale as fast. Thus, the percentage of nets which can be observed or repaired through FIB probing or circuit editing is significantly decreased for advanced pro...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2011
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| Online Access: | http://ndltd.ncl.edu.tw/handle/39544623838264817356 |