High-Frequency Small-Signal and Noise Characterization for Advanced MOSFETs Considering Temperature Dependence

博士 === 國立交通大學 === 電子研究所 === 99 === This dissertation provides a comprehensive high-frequency small-signal and noise characterization and modeling for various kinds of modern planar MOSFET devices, including the bulk MOSFET, silicon-on-insulator (SOI) MOSFET, partially-depleted SOI dynamic threshold...

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Bibliographic Details
Main Authors: Wang, Sheng-Chun, 王生圳
Other Authors: Su, Pin
Format: Others
Language:en_US
Published: 2011
Online Access:http://ndltd.ncl.edu.tw/handle/91845434978315698583