A New Experimental Determination of Transport Parameters in High Performance Schottky-Barrier MOSFETs

碩士 === 國立交通大學 === 電子研究所 === 99 === In recent years, SBMOS with metal-silicided source/drain has received much attention for its better Ion/Ioff ratio and the immunity to short channel effect but has shown a worse performance due to Schottky junction at the silicide and the channel. In order to allev...

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Bibliographic Details
Main Authors: Cheng, Xhiz-Song, 鄭士嵩
Other Authors: Chung, Steve S.
Format: Others
Language:en_US
Published: 2010
Online Access:http://ndltd.ncl.edu.tw/handle/96242599112857809132